Bragg Grating Fabrication on Tapered Fiber Tips based on Focused Ion Beam Milling

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Date
2015
Authors
Ricardo Melo André
Becker,M
Dellith,J
Rothhardt,M
Zibaii,MI
Latifi,H
Manuel Joaquim Marques
Bartelt,H
Orlando Frazão
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Abstract
Focused ion beam milling is used on chemically etched tapered fiber tips to create fiber Bragg gratings. These fiber Bragg gratings are based on a modulation of silica and external medium. This leads to a wide and structured spectrum obtained due to imperfections and the inherent structure of the tip. The fiber Bragg gratings presented are very short and have a length of 27 mu m and 43 mu m and are milled on the tapered fiber tip. They are characterized in the high temperature range 350-850 degrees C and a sensitivity of 14.4 pm/K is determined.
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