Analysis of phase interrogation of SPR fiber optic sensors with characteristics tailored by the application of different metal-dielectric overlays

Abstract

Optical fiber sensors based on the phenomenon of plasmonic resonance can be interrogated applying different methods, the most common one being the spectral approach where the measurand information is derived from the reading of the wavelength resonance dip. In principle, a far better performance can be achieved considering the reading of the phase of the light at a specific wavelength located within the spectral plasmonic resonance. This approach is investigated in this work for fiber optic SPR sensors with overlays which are combinations of metallic and dielectric thin films, permitting not only to tune the wavelength of the SPR resonance but also the sensitivity associated with the phase interrogation of the sensors.