Bragg Grating Fabrication on Tapered Fiber Tips based on Focused Ion Beam Milling

Abstract

Focused ion beam milling is used on chemically etched tapered fiber tips to create fiber Bragg gratings. These fiber Bragg gratings are based on a modulation of silica and external medium. This leads to a wide and structured spectrum obtained due to imperfections and the inherent structure of the tip. The fiber Bragg gratings presented are very short and have a length of 27 mu m and 43 mu m and are milled on the tapered fiber tip. They are characterized in the high temperature range 350-850 degrees C and a sensitivity of 14.4 pm/K is determined.