Please use this identifier to cite or link to this item: http://repositorio.inesctec.pt/handle/123456789/4790
Title: An I2C Based Mixed-Signal Test and Measurement Infrastructure
Authors: Salazar Escobar,AJS
José Machado da Silva
Miguel Velhote Correia
Issue Date: 2014
Abstract: The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.
URI: http://repositorio.inesctec.pt/handle/123456789/4790
http://dx.doi.org/10.1109/ims3tw.2014.6997396
metadata.dc.type: conferenceObject
Publication
Appears in Collections:C-BER - Articles in International Conferences
CTM - Articles in International Conferences

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