Focused ion beam post-processing of optical fiber Fabry-Perot cavities for sensing applications
Focused ion beam post-processing of optical fiber Fabry-Perot cavities for sensing applications
dc.contributor.author | Ricardo Melo André | en |
dc.contributor.author | Pevec,S | en |
dc.contributor.author | Becker,M | en |
dc.contributor.author | Dellith,J | en |
dc.contributor.author | Rothhardt,M | en |
dc.contributor.author | Manuel Joaquim Marques | en |
dc.contributor.author | Donlagic,D | en |
dc.contributor.author | Bartelt,H | en |
dc.contributor.author | Orlando Frazão | en |
dc.date.accessioned | 2017-11-20T10:39:33Z | |
dc.date.available | 2017-11-20T10:39:33Z | |
dc.date.issued | 2014 | en |
dc.description.abstract | Focused ion beam technology is combined with chemical etching of specifically designed fibers to create Fabry-Perot interferometers. Hydrofluoric acid is used to etch special fibers and create microwires with diameters of 15 mu m. These microwires are then milled with a focused ion beam to create two different structures: an indented Fabry-Perot structure and a cantilever Fabry-Perot structure that are characterized in terms of temperature. The cantilever structure is also sensitive to vibrations and is capable of measuring frequencies in the range 1 Hz - 40 kHz. (C) 2014 Optical Society of America | en |
dc.identifier.uri | http://repositorio.inesctec.pt/handle/123456789/3550 | |
dc.identifier.uri | http://dx.doi.org/10.1364/oe.22.013102 | en |
dc.language | eng | en |
dc.relation | 5067 | en |
dc.relation | 4061 | en |
dc.relation | 4383 | en |
dc.rights | info:eu-repo/semantics/openAccess | en |
dc.title | Focused ion beam post-processing of optical fiber Fabry-Perot cavities for sensing applications | en |
dc.type | article | en |
dc.type | Publication | en |